纳米定位测量,哥德尔,和自举法
Nanopositioning Metrology, Gödel, and Bootstraps

原始链接: https://www.pi-usa.us/en/tech-blog/nanopositioning-metrology-goedel-and-bootstraps

## 纳米定位系统特性总结 表征纳米定位系统需要理解频域(使用FFT分析识别共振)和时域行为。虽然频率分析可以揭示共振频率,但缺乏时间和位置的相关性,并且依赖于外部测量,例如激光振动测量,才能获得准确的结果。 与阶跃系统不同,闭环压电定位器由于其模拟特性,理论上具有无限分辨率。然而,实际分辨率受微摩擦和电子噪声的限制,通常约为测量到的峰峰值噪声的1/6(1σ)。 重要的是,分析定位器实现的*离散步进*——即使在纳米级尺度下——也能提供有关系统稳定性、可重复性和整体性能的宝贵见解,直接反映系统在实际应用中的功能,例如成像和对准。这些图形数据补充了统计噪声测量,从而实现全面的系统评估。

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原文

Frequency domain measurements (FFT analysis) are useful to characterize system resonances. Frequency domain information, however, offers no time / position correlation. Again, for meaningful results, measurements need to rely on independent external metrology, such as laser vibrometry.

Because of the analog nature of the amplifiers and sensors usually employed in closed-loop piezo positioners, resolution is not determined by discrete steps (as is typical with stepper motors or incremental encoders), making it theoretically infinite. In reality, there is always micro friction to be considered and sensor and control-electronics noise also have an impact on the practically usable resolution. For typical imaging, positioning, and alignment applications, the practically usable resolution is 1σ Ÿ the independently-measured positional noise, or ~1/6 of the peak-peak noise. As stated above, in addition to this statistical figure, the graphical data of nanometer sized discrete steps performed by the positioner reveals a great deal of information on system response, stability, and repeatability and is directly applicable to the way nanopositioning systems are used.

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